High-frequency fatigue test of metallic thin films using...

IEICE Electronics Express 2012 Vol. 9; Iss. 5

High-frequency fatigue test of metallic thin films using PVDF microactuator

Tamjidi, Nastaran, Sato, Kohei, Suzaki, Ryo, Nakamitsu, Yutaka, Sakurai, Junpei, Hata, Seiichi
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Volume:
9
Year:
2012
Language:
english
Journal:
IEICE Electronics Express
DOI:
10.1587/elex.9.403
File:
PDF, 1.60 MB
english, 2012
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