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Low-energy block-level instantaneous comparison 7T SRAM for dual modular redundancy
Okumura, Shunsuke, Nakata, Yohei, Yanagida, Koji, Kagiyama, Yuki, Yoshimoto, Shusuke, Kawaguchi, Hiroshi, Yoshimoto, MasahikoVolume:
9
Year:
2012
Language:
english
Journal:
IEICE Electronics Express
DOI:
10.1587/elex.9.470
File:
PDF, 625 KB
english, 2012