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Probing Depth Study of Conversion Electron/He Ion Yield XAFS Spectroscopy on Strontium Titanate Thin Films.
YANASE, Etsuya, WATANABE, Iwao, HARADA, Makoto, TAKAHASHI, Masao, DAKE, Yoshinori, HIROSHIMA, YasushiVolume:
15
Year:
1999
Language:
english
Journal:
Analytical Sciences
DOI:
10.2116/analsci.15.255
File:
PDF, 53 KB
english, 1999