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Characterization of the Oxidized .BETA.-Si3N4 Whisker Surface Layer Using XPS and TOF-SIMS.
TOKUSE, Masahiro, OYAMA, Ryuji, NAKAGAWA, Hamazo, NAKABAYASHI, IchiroVolume:
17
Year:
2001
Language:
english
Journal:
Analytical Sciences
DOI:
10.2116/analsci.17.281
File:
PDF, 243 KB
english, 2001