Glass bead method using thin film standards for analyses of silicates by secondary target XRF spectrometry.
KOBAYASHI, Yoshinori, NAKAMURA, SusumuVolume:
38
Year:
1989
Journal:
Bunseki kagaku
DOI:
10.2116/bunsekikagaku.38.6_t85
File:
PDF, 424 KB
1989