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Measurement of polymer film thickness based on throretical calculation of Rh K.ALPHA. X-ray Compton scattering intensity.
OCHI, Hirotomo, SHIOTA, Tadahiro, NISHINO, MakotoVolume:
43
Year:
1994
Journal:
Bunseki kagaku
DOI:
10.2116/bunsekikagaku.43.371
File:
PDF, 874 KB
1994