Determination of trace impurities in silicon carbide by...

Determination of trace impurities in silicon carbide by ICP-MS.

NAKA, Hirohito, KURAYASU, Hirofumi
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Volume:
45
Year:
1996
Journal:
Bunseki kagaku
DOI:
10.2116/bunsekikagaku.45.1139
File:
PDF, 784 KB
1996
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