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Refinement and application of X-ray diffraction method as the surface roughness analysis.
NAKASHIMA, Mikako, KOSAKA, Masao, MONMA, HidekiVolume:
51
Year:
2002
Journal:
BUNSEKI KAGAKU
DOI:
10.2116/bunsekikagaku.51.707
File:
PDF, 8.64 MB
2002