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Investigation of ZrOx/ZrC–ZrN/Zr thin-film structural evolution and their degradation using X-ray diffraction and Raman spectrometry
Usmani, B., Vijay, V., Chhibber, R., Dixit, A.Volume:
122
Language:
english
Journal:
Applied Physics A
DOI:
10.1007/s00339-016-0523-8
Date:
November, 2016
File:
PDF, 2.81 MB
english, 2016