Effective Schottky barrier lowering of Ni silicide/p-Si(100) using an ytterbium confinement structure for high performance n-type MOSFETs
Shen, Keng-Hui, Chen, Szu-Hung, Liu, Wei-Ting, Wu, Bao-Hsien, Chen, Lih-JuannLanguage:
english
Journal:
Materials & Design
DOI:
10.1016/j.matdes.2016.11.084
Date:
November, 2016
File:
PDF, 1.50 MB
english, 2016