![](/img/cover-not-exists.png)
[IEEE 2016 IEEE 21st International Conference on Emerging Technologies and Factory Automation (ETFA) - Berlin, Germany (2016.9.6-2016.9.9)] 2016 IEEE 21st International Conference on Emerging Technologies and Factory Automation (ETFA) - A Test bed dedicated to the Study of Vulnerabilities in IEC 61850 Power Utility Automation Networks
Kabir-Querrec, Maelle, Mocanu, Stephane, Thiriet, Jean-Marc, Savary, EricYear:
2016
Language:
english
DOI:
10.1109/etfa.2016.7733644
File:
PDF, 306 KB
english, 2016