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Volatility Characterisation for RRAM devices
Gupta, Isha, Serb, Alexantrou, Berdan, Radu, Khiat, Ali, Prodromakis, ThemistoklisYear:
2016
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2016.2631631
File:
PDF, 844 KB
english, 2016