A comprehensive metering scheme for intellectual property protection during both after-sale and evaluation periods of IC design
Pan, Aobo, Lin, Yaping, Che, Wenjie, You, Zhiqiang, Liu, Yonghe, Li, JinguoVolume:
10
Year:
2013
Language:
english
Journal:
IEICE Electronics Express
DOI:
10.1587/elex.10.20130649
File:
PDF, 2.74 MB
english, 2013