Probe calibration by using a different type of probe as a...

IEICE Electronics Express 2010 Vol. 7; Iss. 6

Probe calibration by using a different type of probe as a reference in GTEM cell above 1GHz

Wu, Ifong, Ishigami, Shinobu, Gotoh, Kaoru, Matsumoto, Yasushi
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Volume:
7
Year:
2010
Language:
english
Journal:
IEICE Electronics Express
DOI:
10.1587/elex.7.460
File:
PDF, 1.67 MB
english, 2010
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