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Analysis of Crystallographic Orientation of Elongated β-Si3N4 Particles in In Situ Si3N4 Composite by Electron Back Scattered Diffraction Method
YASUTOMI, Yoshiyuki, SAKAIDA, Yoshihisa, HIROSAKI, Naoto, IKUHARA, YuichiVolume:
106
Year:
1998
Language:
english
Journal:
Journal of the Ceramic Society of Japan
DOI:
10.2109/jcersj.106.980
File:
PDF, 3.81 MB
english, 1998