Analysis through use of peak areas of fast scan square-wave voltammograms.
AOKI, Koichi, MAEDA, Kazunobu, TOKUDA, Koichi, MATSUDA, Hiroaki, HASEBE, KiyoshiVolume:
36
Year:
1987
Journal:
Bunseki kagaku
DOI:
10.2116/bunsekikagaku.36.7_420
File:
PDF, 679 KB
1987