Transmission electron microscopy as a realistic data source...

Computational Materials Science 2017 / 02 Vol. 128

Transmission electron microscopy as a realistic data source for the micromagnetic simulation of polycrystalline nickel nanowires

França, C.A., Guerra, Y., Valadão, D.R.B., Holanda, J., Padrón-Hernández, E.
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Volume:
128
Language:
english
Journal:
Computational Materials Science
DOI:
10.1016/j.commatsci.2016.11.007
Date:
February, 2017
File:
PDF, 663 KB
english, 2017
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