Improved sensitivity at synchrotrons using edge...

Journal of Instrumentation 2013 / 06 Vol. 8; Iss. 6

Improved sensitivity at synchrotrons using edge illumination X-ray phase-contrast imaging

Diemoz, P C, Endrizzi, M, Zapata, C E, Bravin, A, Speller, R D, Robinson, I K, Olivo, A
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Volume:
8
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/8/06/C06002
Date:
June, 2013
File:
PDF, 1.41 MB
english, 2013
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