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[IEEE 2016 17th Latin-American Test Symposium (LATS) - Foz do Iguacu (2016.4.6-2016.4.8)] 2016 17th Latin-American Test Symposium (LATS) - A probabilistic model for stuck-on faults in combinational logic gates
Schivittz, Rafael B., Franco, Denis T., Meinhardt, Cristina, Butzen, Paulo F.Year:
2016
Language:
english
DOI:
10.1109/latw.2016.7483337
File:
PDF, 2.11 MB
english, 2016