Calculating semiconductor parameters based on measuring electrical and thermophysical, galvanic and thermomagnetic effects using the method of varying the influence factors
I. S. Lisker, M. B. PevznerVolume:
34
Language:
english
Pages:
6
DOI:
10.1007/bf00859919
Date:
March, 1978
File:
PDF, 430 KB
english, 1978