Calculating semiconductor parameters based on measuring...

Calculating semiconductor parameters based on measuring electrical and thermophysical, galvanic and thermomagnetic effects using the method of varying the influence factors

I. S. Lisker, M. B. Pevzner
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Volume:
34
Language:
english
Pages:
6
DOI:
10.1007/bf00859919
Date:
March, 1978
File:
PDF, 430 KB
english, 1978
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