TFT-LCD Mura Defect Detection Using Wavelet and Cosine Transforms
CHEN, Shang-Liang, CHOU, Shang-TaVolume:
2
Year:
2008
Language:
english
Journal:
Journal of Advanced Mechanical Design, Systems, and Manufacturing
DOI:
10.1299/jamdsm.2.441
File:
PDF, 1.61 MB
english, 2008