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Methodology of measuring the transverse piezoresistance of semiconductors
V. Ya. Duchal, V. N. Ermakov, V. V. Kolomoets, Yu. A. Okhrimenko, V. S. TimoshchukVolume:
31
Language:
english
Pages:
3
DOI:
10.1007/bf00863897
Date:
September, 1988
File:
PDF, 252 KB
english, 1988