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Effect of flaw size on elevated temperature static fatigue limit of silicon nitride.
MACHIDA, Takashi, USAMI, Saburo, TAKAHASHI, IchiroVolume:
53
Year:
1987
Journal:
Transactions of the Japan Society of Mechanical Engineers Series A
DOI:
10.1299/kikaia.53.1558
File:
PDF, 1.15 MB
1987