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Development of SIMUS 2D/F: A stress analysis program for thin multilayer structure.
SAITO, Naoto, SAKATA, Shinji, SHIMIZU, Tasuku, ISOMAE, Seiichi, MASUDA, HirooVolume:
55
Year:
1989
Journal:
Transactions of the Japan Society of Mechanical Engineers Series A
DOI:
10.1299/kikaia.55.1652
File:
PDF, 628 KB
1989