Melecular Dynamics Study of Stress Effects on Raman...

TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series A 1997 Vol. 63; Iss. 611

Melecular Dynamics Study of Stress Effects on Raman Frequencies of Crystalline Silicon.

IWASAKI, Tomio, SASAKI, Naoya, MORIYA, Hiroshi, MIURA, Hideo, ISHITSUKA, Norio
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Volume:
63
Year:
1997
Journal:
Transactions of the Japan Society of Mechanical Engineers Series A
DOI:
10.1299/kikaia.63.1511
File:
PDF, 650 KB
1997
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