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Development of In-Situ Surface Observation System with an Atomic Resolution under Tensile Stress by Atomic Force Microscope.
MATSUMURO, Akihito, KAYUKAWA, Kimiharu, FUJIMOTO, Yohei, ANDO, Taeko, SATO, KazuoVolume:
69
Year:
2003
Journal:
Transactions of the Japan Society of Mechanical Engineers Series A
DOI:
10.1299/kikaia.69.330
File:
PDF, 1.40 MB
2003