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A New Reflectometer for Measuring a Spectrum of Hemispherical Reflectance for Perfect-Diffuse Hemispherical Irradiation.
Makino, Toshiro, Yoshida, Toshimi, Tanaka, SadayukiVolume:
59
Year:
1993
Journal:
Transactions of the Japan Society of Mechanical Engineers Series B
DOI:
10.1299/kikaib.59.2875
File:
PDF, 723 KB
1993