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The Influence of the Matrix Glass and Al2O3 Substrate on the Electrical Conduction Paths in the SnO2 Thick Film Resistor System
SHIOMI, Haruhisa, NAKAMURA, Masahiko, MATSUMURA, Yoshiaki, FUJIMURA, Kenji, ISHIGAME, Jyuji, ONOUE, KazuakiVolume:
100
Year:
1992
Journal:
Journal of the Ceramic Society of Japan
DOI:
10.2109/jcersj.100.634
File:
PDF, 2.12 MB
1992