X-ray Photoelectron Spectroscopy(XPS) Study of Fracture Mechanism in Sintered Si3N4.
OZAWA, Masahiro, FURUKAWA, Yoichiro, OGAWA, Mitsushige, ISOZAKI, KeiVolume:
108
Year:
2000
Journal:
Journal of the Ceramic Society of Japan
DOI:
10.2109/jcersj.108.61
File:
PDF, 1.06 MB
2000