X-Ray Fluorescence and Reflectivity Analysis of...

X-Ray Fluorescence and Reflectivity Analysis of Multiple-Layer Thin Films.

HUANG, Ting C., LEE, Wen Y.
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Volume:
11
Year:
1995
Language:
english
Journal:
Analytical Sciences
DOI:
10.2116/analsci.11.529
File:
PDF, 273 KB
english, 1995
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