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Analysis of thermal degradation in Nylon 66 by X-ray photoelectron spectrometry, X-ray diffraction and differential scanning calorimetry.
SHICHI, Yushi, INOUE, Yasuhide, ARITA, Masaharu, KUNIYA, Jyoji, ASHIDA, TadashiVolume:
39
Year:
1990
Journal:
Bunseki kagaku
DOI:
10.2116/bunsekikagaku.39.33
File:
PDF, 548 KB
1990