Profile mapping analysis of deteriorated cultural property...

Profile mapping analysis of deteriorated cultural property with micro X-ray diffractometer.

KUCHITSU, Nobuaki, HIRAO, Yoshimitsu
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Volume:
41
Year:
1992
Journal:
Bunseki kagaku
DOI:
10.2116/bunsekikagaku.41.11_597
File:
PDF, 296 KB
1992
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