Estimation of Delay Test Quality and Its Application to...

IPSJ Transactions on System LSI Design Methodology 2008 Vol. 1

Estimation of Delay Test Quality and Its Application to Test Generation

Kajihara, Seiji, Morishima, Shohei, Yamamoto, Masahiro, Wen, Xiaoqing, Fukunaga, Masayasu, Hatayama, Kazumi, Aikyo, Takashi
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Volume:
1
Year:
2008
Language:
english
Journal:
IPSJ Transactions on System LSI Design Methodology
DOI:
10.2197/ipsjtsldm.1.104
File:
PDF, 373 KB
english, 2008
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