Modeling Electromigration for Microelectronics Design
ZHU, Xiao, KOTADIA, Hiren, XU, Sha, LU, Hua, MANNAN, Samjid, BAILEY, Chris, CHAN, YancheongVolume:
7
Year:
2013
Language:
english
Journal:
Journal of Computational Science and Technology
DOI:
10.1299/jcst.7.251
File:
PDF, 2.24 MB
english, 2013