New interferometric method for determining the refractive index of thin dielectric film, its thickness, the phase shift, and the order of interference
N. Barakat, F. F. A. El-Shazly, H. T. El-ShairVolume:
14
Language:
english
Pages:
5
DOI:
10.1007/bf00882738
Date:
November, 1977
File:
PDF, 378 KB
english, 1977