New interferometric method for determining the refractive...

New interferometric method for determining the refractive index of thin dielectric film, its thickness, the phase shift, and the order of interference

N. Barakat, F. F. A. El-Shazly, H. T. El-Shair
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Volume:
14
Language:
english
Pages:
5
DOI:
10.1007/bf00882738
Date:
November, 1977
File:
PDF, 378 KB
english, 1977
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