Analysis of Direct Current Potential Field around Multiple...

Analysis of Direct Current Potential Field around Multiple Spherical Defects.

Tada, Naoya, Nakayama, Eisuke, Kitamura, Takayuki, Ohtani, Ryuichi
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Volume:
43
Year:
2000
Journal:
JSME International Journal Series A
DOI:
10.1299/jsmea.43.109
File:
PDF, 1.29 MB
2000
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