Electronic Characteristics Changes of Semiconductor Devices...

Electronic Characteristics Changes of Semiconductor Devices Caused by Packaging Stress.

Miura, Hideo, Nishimura, Asao
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Volume:
61
Year:
1995
Journal:
Transactions of the Japan Society of Mechanical Engineers Series A
DOI:
10.1299/kikaia.61.1957
File:
PDF, 848 KB
1995
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