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Thermal Analysis of SOI Transistor Devices in LSI Chips.
HIRASAWA, Shigeki, NAKAZATO, Norio, YOSHIHARA, Kazuhiro, NAGAI, Kenji, YAMAGUCHI, Hizuru, OWADA, NobuoVolume:
62
Year:
1996
Journal:
Transactions of the Japan Society of Mechanical Engineers Series B
DOI:
10.1299/kikaib.62.405
File:
PDF, 497 KB
1996