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Temperature-dependent power-law model for submicron CMOS circuits EOS breakdown study
Tseng, Yuan-Hung, Chang, Yu-Chia, Wu, Xiao-JingVolume:
13
Year:
2016
Language:
english
Journal:
IEICE Electronics Express
DOI:
10.1587/elex.13.20160248
File:
PDF, 3.03 MB
english, 2016