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Analysis of Additives on BeO-Doped SiC Ceramics by Secondary Ion Mass Spectroscopy
TANAKA, Shigeru, SAKAGUCHI, Isao, YASUTOMI, Yoshiyuki, MIYATA, Motoyuki, SAWAI, Yuuichi, TAKAHASHI, KenVolume:
103
Year:
1995
Journal:
Journal of the Ceramic Society of Japan
DOI:
10.2109/jcersj.103.870
File:
PDF, 1.13 MB
1995