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Transmission Electron Microscopy Study of Defect Structure in Epitaxial SnO2 Rutile Thin Film.
SUZUKI, Toshimasa, WAKABAYASHI, Hirotaka, NISHI, Yuji, FUJIMOTO, MasayukiVolume:
110
Year:
2002
Language:
english
Journal:
Journal of the Ceramic Society of Japan
DOI:
10.2109/jcersj.110.86
File:
PDF, 4.38 MB
english, 2002