TEM Analysis of Impurity Induced Microstructures in...

TEM Analysis of Impurity Induced Microstructures in Sintered Aluminium Nitride Ceramics

HAGÈGE, Serge, ISHIDA, Yoichi, TANAKA, Shun-ichiro
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Volume:
96
Year:
1988
Language:
english
Journal:
Journal of the Ceramic Society of Japan
DOI:
10.2109/jcersj.96.1119
File:
PDF, 2.49 MB
english, 1988
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