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Characteristics of Au/SBT/LZO/Si MFIS structure for ferroelectric-gate field-effect transistors
IM, Jong-Hyun, PARK, Byung-EunVolume:
117
Year:
2009
Language:
english
Journal:
Journal of the Ceramic Society of Japan
DOI:
10.2109/jcersj2.117.1035
File:
PDF, 503 KB
english, 2009