Stress engineering of the alkoxide derived ferroelectric...

Stress engineering of the alkoxide derived ferroelectric thin film on Si wafer

OHNO, Tomoya, MALIČ, Babara, FUKAZAWA, Hiroaki, WAKIYA, Naoki, SUZUKI, Hisao, MATSUDA, Takeshi, KOSEC, Marija
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Volume:
117
Year:
2009
Language:
english
Journal:
Journal of the Ceramic Society of Japan
DOI:
10.2109/jcersj2.117.1089
File:
PDF, 728 KB
english, 2009
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