Characterization of Metal Oxide Surfaces and Thin Semiconductor Films by Inelastic Electron Tunneling Spectroscopy.
HIGO, Morihide, KAMATA, SatsuoVolume:
18
Year:
2002
Language:
english
Journal:
Analytical Sciences
DOI:
10.2116/analsci.18.227
File:
PDF, 688 KB
english, 2002