Determination of impurities in silicon nitride by...

Determination of impurities in silicon nitride by inductively coupled plasma emission spectrometry.

ISHIZUKA, Toshio, UWAMINO, Yoshinori, TSUGE, Akira
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Volume:
33
Year:
1984
Journal:
Bunseki kagaku
DOI:
10.2116/bunsekikagaku.33.9_486
File:
PDF, 807 KB
1984
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