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Scan FF Reordering for Test Volume Reduction in Chiba-scan Architecture
Matsumoto, Kiyonori, Namba, Kazuteru, Ito, HideoVolume:
4
Year:
2011
Language:
english
Journal:
IPSJ Transactions on System LSI Design Methodology
DOI:
10.2197/ipsjtsldm.4.140
File:
PDF, 739 KB
english, 2011