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Nanoindentation Behaviour and Annealed Microstructural Evolution of Ni/Si Thin Film
Lee, Woei-Shyan, Chen, Tao-Hsing, Lin, Chi-Feng, Chen, Jyun-MingVolume:
52
Year:
2011
Language:
english
Journal:
MATERIALS TRANSACTIONS
DOI:
10.2320/matertrans.m2010323
File:
PDF, 3.73 MB
english, 2011