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Effect of Rapid Thermal Annealing on the Electrical and Structural Properties of Se Schottky Contacts to n-Type Si
Janardhanam, V., Kil, Yeon-Ho, Shim, Kyu-Hwan, Reddy, V. Rajagopal, Choi, Chel-JongVolume:
54
Year:
2013
Language:
english
Journal:
MATERIALS TRANSACTIONS
DOI:
10.2320/matertrans.m2013075
File:
PDF, 1.99 MB
english, 2013