Development of the Parametric Analysis Method of Thermal Stress Using Homogeneous Modeling and Structural Reliability Evaluation for SOFC Module
TSURUKI, Masaki, MACHIDA, Takashi, TOKOI, Hiromi, HIWATASHI, KenichiVolume:
77
Year:
2009
Journal:
Electrochemistry
DOI:
10.5796/electrochemistry.77.229
File:
PDF, 1.62 MB
2009